Born June 26th 1978, Italian Citizen
Ph.D. in Material Science and Technology, University of Genova, Italy, 2007
Thesis: “Spectroscopic Ellipsometry as a tool for characterizing nano-sized biological materials” Tutor: prof. M. Canepa, Physics Dept. University of Genova
M.S. in Physics, University of Genova, Italy, 2003
Thesis: “Studio di film ultrasottili organici mediante Ellissometria Spettroscopica” (in Italian) Tutor: prof. M. Canepa, Physics Dept. University of Genova
Facility Coordinator at IIT - Istituto Italiano di Tecnologia
Materials Characterization Facility (since January 2017)
Technologist at IIT - Istituto Italiano di Tecnologia, Nanochemistry Dept.
In charge of the Advanced Characterizations Facility. (April 2014 – December 2016)
Junior Post-Doc at IIT – Istituto Italiano di Tecnologia, Nanochemistry Dept.
In charge of the X-rays Photoelectron Spectroscopy (XPS) laboratory and of surface related spectroscopies. (April 2011 – March 2014)
Post-Doc at INFN – Istituto Nazionale di Fisica Nucleare, Unità di Genova.
XPS, Atomic Force Microscopy (AFM) and Spectroscopic Ellipsometry (SE) characterization of dielectric coatings for third generation gravitational waves detectors. (July 2009 – March 2011)
Post-Doc at Physics Dept., University of Genova.
XPS and SE characterization of inorganic and organic thin films (March 2007 – June 2009)
Preparation of molecular layers on substrates through self-assembly, spin coating, drop casting, layer-by-layer techniques
Langmuir-Blodgett assembly of nanocrystals
Materials characterization through X-rays Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Spectroscopic Ellipsometry (SE), X-rays Powder Diffraction (XRD)
Basic knowledge of Cyclic Voltammetry (CV)
IIT Unit Coordinator Research and Innovation Staff Exchange (RISE) project SONAR: Localized Surface Plasmon Resonance in doped semiconductor nanocrystals (Marie Skłodowska-Curie grant agreement no. ). Project webpage: http://www.sonar-h2020.eu/