Equipped with four microscopes: two scanning electron microscopes (SEM), one of which is devoted to routine analysis even in low vacuum condition, and the other is a high-resolution machine with analytical capabilities, and two transmission electron microscopes (TEM). The first TEM is a 100 kV machine for routine analysis, the other is a 200 kV TEM/STEM High-resolution instrument equipped with a Cs-corrector of the objective lens, an in-column omega filter, that acts also as Electron Energy Loss (EEL) Spectrometer, and a Energy Dispersive Spectroscopy X-Ray (EDS) detector. The 200 kV TEM/STEM is also provided with heating, cooling and tomographic sample-holder. The lab has an area dedicated to sample preparation of both hard and soft materials in view of TEM/SEM analysis. The listed instrumentation is capable to perform an in-depth characterization of morphology (even in 3D), structure and chemical composition of the studied materials, down to nanometer scale.